MODELING DISLOCATION-INDUCED ANISOTROPIC LINE BROADENING IN RIETVELD REFINEMENTS USING A VOIGT FUNCTION - I - GENERAL-PRINCIPLES

The theory of dislocation-induced X-ray or neutron diffraction line br oadening developed by Krivoglaz et al. and Wilkens has been adapted fo r Rietveld refinement of the powder diffraction profile by fitting a V oigt function to each peak. Information on both the type of slip syste m and the density of dislocations in the crystallites may then be foun d by evaluating the shape parameter and the index-dependent breadth of the Voigt function.