MODELING DISLOCATION-INDUCED ANISOTROPIC LINE BROADENING IN RIETVELD REFINEMENTS USING A VOIGT FUNCTION - II - APPLICATION TO NEUTRON POWDER DIFFRACTION DATA

In paper I [Wu et al. (1998). J. Appl. Cryst. 31, 356-362] an approach was developed to the problem of modelling dislocation-induced X-ray o r neutron-diffraction-line broadening. This paper applies those findin gs to the Rietveld refinement of the neutron powder diffraction profil es of deuterium-cycled LaNi5 and beta-PdD0.66. These interstitially mo dified materials exhibit, respectively, strong and weak anisotropic st rain broadening. The broadening in LaNi5 is consistent with a dislocat ion slip system a/3[(2) over bar 110]{0 (1) over bar 10}, in agreement with transmission electron microscopy studies. In PdD0.66 the model p redicts a regular distribution of screw dislocations, which remains to be confirmed by other techniques.