IMAGE PLATES AS ONE-DIMENSIONAL DETECTORS IN HIGH-RESOLUTION X-RAY-DIFFRACTION

An image plate has been used as a detector for high-resolution X-ray d iffraction of semiconductor heterostructures. A series of 2 theta inte nsity distributions is recorded for different rocking angles omega for the sample and subsequently transformed to a reciprocal-space map. Ma ps of symmetric and asymmetric reflections of two samples are presente d. A reduction in measurement time by a factor of 36 was achieved by r ecording information simultaneously along 2 theta on the image plate c ompared to conventional measurement with a scintillation counter. Favo urable results were obtained with broad reflections from samples with low structural quality and asymmetric reflections in the grazing exit geometry.