E. Petitprez et al., OPTICAL-PROPERTIES OF VERTICALLY STACKED INAS ISLAND LAYERS GROWN ON (311)A B AND (001)GAAS SUBSTRATES/, Microelectronic engineering, 43-4, 1998, pp. 59-65
The optical properties of vertically stacked InAs island layers grown
by molecular beam epitaxy on (311)A/B and (001) GaAs substrates have b
een studied by means of photoluminescence (PL) and transmission electr
on microscopy (TEM) measurements. These properties were systematically
investigated as a function of spacer layer thickness, orientation, an
d temperature. Spacer layer thickness variation exhibits influence on
PL spectra for all orientations. Differences in peak shape, position,
amplitude and integrated photoluminescence have also been observed for
all surfaces. The results show an increase of integrated PL intensity
of similar to 5 times and a decrease of spectral linewidth compared w
ith a single set of islands, suggesting a possible electronic coupling
between the layers. In addition, in the case of (311)A, the structure
does not exhibit QD formation. (C) 1998 Elsevier Science B.V. All rig
hts reserved.