OPTICAL CHARACTERIZATION OF GAAS ALAS SHORT-PERIOD SUPERLATTICES/

Citation
Dh. Woo et al., OPTICAL CHARACTERIZATION OF GAAS ALAS SHORT-PERIOD SUPERLATTICES/, Microelectronic engineering, 43-4, 1998, pp. 265-270
Citations number
21
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
43-4
Year of publication
1998
Pages
265 - 270
Database
ISI
SICI code
0167-9317(1998)43-4:<265:OCOGAS>2.0.ZU;2-A
Abstract
We present optical studies of a series of GaAs/AlAs short period super lattices grown by molecular beam epitaxy. The structural properties we re examined by X-ray diffraction measurements. The quantum confinement of the electronic and the vibronic states were observed in the low te mperature photoluminescence and Raman scattering experiments, respecti vely. Spectroscopic ellipsometric (SE) measurements were also performe d. We found a new structure at the lower E-2 peak, which is the best r esolution of the E-2 structure in these SLs so far obtained by SE. (C) 1998 Elsevier Science B.V. All rights reserved.