EXPLOITING INTERFACE FORM BIREFRINGENCE IN VERTICAL MICROCAVITIES

Citation
Ec. Valadares et al., EXPLOITING INTERFACE FORM BIREFRINGENCE IN VERTICAL MICROCAVITIES, Microelectronic engineering, 43-4, 1998, pp. 605-610
Citations number
9
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
43-4
Year of publication
1998
Pages
605 - 610
Database
ISI
SICI code
0167-9317(1998)43-4:<605:EIFBIV>2.0.ZU;2-N
Abstract
We consider a new two-dimensional form birefringence effect associated with periodic corrugations in semiconductor/oxide interfaces of large -index-step high contrast Bragg (DBR) mirrors of vertical microcavitie s. A illustrative model is proposed in which the corrugations have a s quare-wave profile with an alternating refraction index whose period i s much smaller than the cavity mode wavelength. Negative and positive uniaxial birefringence are considered in our discussion and related to growth conditions. This new effect has potential use in polarization controlled emission of vertical cavity surface emitting lasers. (C) 19 98 Elsevier Science B.V. All rights reserved.