FABRICATION OF SILICON QUANTUM WIRES BY ANISOTROPIC WET CHEMICAL ETCHING AND THERMAL-OXIDATION

Citation
Jl. Liu et al., FABRICATION OF SILICON QUANTUM WIRES BY ANISOTROPIC WET CHEMICAL ETCHING AND THERMAL-OXIDATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(5), 1995, pp. 2137-2138
Citations number
12
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
13
Issue
5
Year of publication
1995
Pages
2137 - 2138
Database
ISI
SICI code
1071-1023(1995)13:5<2137:FOSQWB>2.0.ZU;2-9
Abstract
Ultrafine silicon quantum wires with high-quality Si/SiO2 heterointerf aces are successfully fabricated by utilizing anisotropic wet chemical etching and subsequent thermal oxidation. It is also found that the l ateral dimensions of silicon quantum wires can be well controlled by s electing the temperature of the thermal oxidation process. The cross-s ectional image from a scanning electron microscope shows silicon quant um wires of high quality with the linewidth down to 20 nn. (C) 1995 Am erican Vacuum Society.