Green light emissions from GaP-AlxGa1-xP single and double heterostruc
tures fabricated by temperature difference method under controlled vap
or pressure liquid phase epitaxy, have been studied. When the luminesc
ent layer GaP is very thin, we have observed efficient free exciton em
issions from GaP-AlxGa1-xP double heterostructures while there is no d
etection from homostructures. At least ten times and two times stronge
r luminescence efficiencies were obtained from double heterostructures
at 77K and loom temperature, respectively. The higher free exciton re
combination efficiency is thought to profit from free carrier confinem
ent by potential barrier at the interface of GaP and AlxGa1-xP. Also,
it is found that shallow impurities enhance the photoluminescence inte
nsities in GaP-AlxGa1-xP double heterostructures.