Liquid phase epitaxial (LPE) growth of GaP layers was carried out on p
yramidal textured GaP (1 1 1)B substrates prepared using photolithogra
phic masking followed by wet chemical etching. High quality LPE layers
with both pyramidal textured p-n junction interfaces and hat surfaces
were realized. LPE growth evolution studies revealed that in the earl
y stage of growth growth mainly occurred on the base floor and the sid
e walls of the pyramids, with hardly any deposition on the top surface
s of pyramids. The valleys between the pyramids were gradually filled,
resulting in hat layer surfaces after an appropriate growth time. Fie
ld emission scanning electron microscopy analysis on cleaved cross-sec
tions showed sharp textured p-n junction interfaces with periodically
arranged pyramidal textured features, and no structural defects were o
bservable. I-V characteristics of the GaP p-n junction diodes confirme
d that LPE growth on textured substrates did not introduce defect stat
es, which may degrade device performance. (C) 1998 Elsevier Science B.
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