F. Reinhardt et al., GAAS SURFACE CONTROL DURING METALORGANIC VAPOR-PHASE EPITAXY BY REFLECTANCE ANISOTROPY SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1427-1430
GaAs(001) surfaces are studied during metalorganic vapor phase epitaxy
by reflectance anisotropy spectroscopy (RAS). In analogy to RAS spect
ra measured from GaAs(001) surfaces under ultrahigh vacuum conditions
which were simultaneously controlled by reflection high-energy electro
n diffraction or low-energy electron diffraction certain surface recon
structions can be assigned to specific RAS spectra. Arsenic-rich disor
dered (4 X 4), centered (4 X 4), and (2 X 4) like surfaces are identif
ied during deoxidation of the substrate at pregrowth heating. After st
arting growth the RAS signal shows oscillations the period of which co
rresponds to the growth of 1 ML of GaAs. This is verified by postgrowt
h layer thickness measurements. A (4 X 4) reconstructed surface before
growth turns out to be the necessary condition for the appearance of
these monolayer oscillations in the RAS signal.