GAAS SURFACE CONTROL DURING METALORGANIC VAPOR-PHASE EPITAXY BY REFLECTANCE ANISOTROPY SPECTROSCOPY

Citation
F. Reinhardt et al., GAAS SURFACE CONTROL DURING METALORGANIC VAPOR-PHASE EPITAXY BY REFLECTANCE ANISOTROPY SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1427-1430
Citations number
16
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
11
Issue
4
Year of publication
1993
Pages
1427 - 1430
Database
ISI
SICI code
1071-1023(1993)11:4<1427:GSCDMV>2.0.ZU;2-F
Abstract
GaAs(001) surfaces are studied during metalorganic vapor phase epitaxy by reflectance anisotropy spectroscopy (RAS). In analogy to RAS spect ra measured from GaAs(001) surfaces under ultrahigh vacuum conditions which were simultaneously controlled by reflection high-energy electro n diffraction or low-energy electron diffraction certain surface recon structions can be assigned to specific RAS spectra. Arsenic-rich disor dered (4 X 4), centered (4 X 4), and (2 X 4) like surfaces are identif ied during deoxidation of the substrate at pregrowth heating. After st arting growth the RAS signal shows oscillations the period of which co rresponds to the growth of 1 ML of GaAs. This is verified by postgrowt h layer thickness measurements. A (4 X 4) reconstructed surface before growth turns out to be the necessary condition for the appearance of these monolayer oscillations in the RAS signal.