MEASUREMENT OF ALP GAP (001) HETEROJUNCTION BAND OFFSETS BY X-RAY PHOTOEMISSION SPECTROSCOPY

Authors
WALDROP JR GRANT RW KRAUT EA
Citation
Jr. Waldrop et al., MEASUREMENT OF ALP GAP (001) HETEROJUNCTION BAND OFFSETS BY X-RAY PHOTOEMISSION SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1617-1620
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
11
Issue
4
Year of publication
1993
Pages
1617 - 1620
Database
ISI
SICI code
1071-1023(1993)11:4<1617:MOAG(H>2.0.ZU;2-6
Abstract
X-ray photoemission spectroscopy has been used to measure the valence band offset DELTAE(v) for the AlP/GaP (001) heterojunction interface. The heterojunction samples were prepared by molecular-beam epitaxy. A value of DELTAE(v)=0.43 eV is obtained (staggered band alignment, with AlP valence band below that of GaP).