Jr. Waldrop et al., MEASUREMENT OF ALP GAP (001) HETEROJUNCTION BAND OFFSETS BY X-RAY PHOTOEMISSION SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1617-1620
X-ray photoemission spectroscopy has been used to measure the valence
band offset DELTAE(v) for the AlP/GaP (001) heterojunction interface.
The heterojunction samples were prepared by molecular-beam epitaxy. A
value of DELTAE(v)=0.43 eV is obtained (staggered band alignment, with
AlP valence band below that of GaP).