Dh. Rich et al., ABSORPTION MODULATION INDUCED BY ELECTRON-BEAM EXCITATION OF STRAINEDIN0.2GA0.8AS GAAS MULTIPLE-QUANTUM WELLS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1717-1722
The effects of excess carrier generation on excitonic absorption pheno
mena in nipi-doped In0.2Ga0.8As/GaAs multiple quantum wells (MQWs) was
examined using a novel technique called electron beam-induced absorpt
ion modulation imaging. The nipi-doping induced barrier height is dete
rmined by measuring the frequency response of the absorption modulatio
n as a function of temperature and employing a model which is based on
thermal excitation of carriers in the limit of Boltzmann statistics.
Spatial steps in the absorption modulation which correlate with the po
sitions and orientation of dark line defects imaged in cathodoluminesc
ence are observed. These results indicate the existence of defects in
the MQWs which impede the ambipolar diffusive transport of the spatial
ly separated electron-hole plasma.