DISLOCATIONS AND GRAIN-SIZE IN ELECTRODEPOSITED NANOCRYSTALLINE NI DETERMINED BY THE MODIFIED WILLIAMSON-HALL AND WARREN-AVERBACH PROCEDURES

Citation
T. Ungar et al., DISLOCATIONS AND GRAIN-SIZE IN ELECTRODEPOSITED NANOCRYSTALLINE NI DETERMINED BY THE MODIFIED WILLIAMSON-HALL AND WARREN-AVERBACH PROCEDURES, Journal of applied crystallography, 31, 1998, pp. 554-558
Citations number
21
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
31
Year of publication
1998
Part
4
Pages
554 - 558
Database
ISI
SICI code
0021-8898(1998)31:<554:DAGIEN>2.0.ZU;2-G
Abstract
Electrodeposited nanocrystalline Ni foils were studied by high-resolut ion X-ray diffractometry. The full width at half-maximum and Fourier c oefficients were found to vary rather anisotropically as a function of diffraction order. The modified Williamson-Hall plot and the modified Warren-Averbach analysis, developed recently by taking into account t he dislocation contrast in peak broadening, have been applied to inter pret this anisotropic behaviour in terms of grain size, dislocation de nsities and twin boundaries. The average grain size has been found to range between 50 and 12 nm, in good agreement with transmission electr on microscopy observations. The average dislocation density has been f ound to be 4.9 (5) x 10(15) m(-2) and the dislocations are of the scre w character.