NUMERICAL-ANALYSIS OF DEVICE PERFORMANCE OF METAMORPHIC INYAL1-YAS INXGA1-XAS LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.6) HEMTS ON GAAS SUBSTRATE/
H. Happy et al., NUMERICAL-ANALYSIS OF DEVICE PERFORMANCE OF METAMORPHIC INYAL1-YAS INXGA1-XAS LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.6) HEMTS ON GAAS SUBSTRATE/, I.E.E.E. transactions on electron devices, 45(10), 1998, pp. 2089-2095
A numerical model describing the influence of InAs mole fraction on me
tamorphic HEMT structures ((MM-HEMT) is proposed. The material propert
ies are calculated using the Monte Carlo method, while the charge cont
rol law is calculated using a self-consistent solution of Poisson's an
d Schrodinger's equations. The modeling of the de, ac, noise and high
frequency performance of a device with 0.25-mu m gate length is perfor
med using the quasi-two-dimensional (Q2D) approach, This analysis show
s that an InAs mole fraction of about 0.40 is an optimum composition f
or manufacturing high gain, low noise amplifiers, In this range of com
position, the performance of MM-HEMT structures is similar to that obt
ained for lattice-matched HEMT's on InP substrates,