SPECIAL ISSUE - RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

Authors
KJAERGAARD C JENSEN F
Citation
C. Kjaergaard et F. Jensen, SPECIAL ISSUE - RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Microelectronics and reliability, 38(6-8), 1998, pp. 9-9
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
38
Issue
6-8
Year of publication
1998
Pages
9 - 9
Database
ISI
SICI code
0026-2714(1998)38:6-8<9:SI-ROE>2.0.ZU;2-W