AN ANALYSIS OF THE QUALITY AND RELIABILITY SUPPLEMENT TO THE SIA ROADMAP

Authors
Citation
Rw. Thomas, AN ANALYSIS OF THE QUALITY AND RELIABILITY SUPPLEMENT TO THE SIA ROADMAP, Microelectronics and reliability, 38(6-8), 1998, pp. 861-868
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00262714
Volume
38
Issue
6-8
Year of publication
1998
Pages
861 - 868
Database
ISI
SICI code
0026-2714(1998)38:6-8<861:AAOTQA>2.0.ZU;2-Z
Abstract
This is an analysis and summary of the Quality and Reliability Supplem ent to the 1997 U. S. Semiconductor Industry Roadmap. The key reliabil ity issue with the semiconductor industry over the past 5 years has be en the lack of improvement in the Early Life (EL) failure rates. Reaso ns for this stagnation are discussed and the constraints to quality an d reliability improvement in general are presented from a survey condu cted by the Q&R team. Major portions of this paper are extracted from the Feb. 1997 Q&R National Technology Roadmap (C) 1998 Elsevier Scienc e Ltd. All rights reserved.