STRAIN DEPENDING RELIABILITY OF AUTOMOTIVE DIODES

After improving the assembly system, the remaining automotive diodes f ailures, above 4% in operation, was associated to the internal strain, based on the RVT test results. The X-ray diffraction spectra the rock ing curves - allowed the pointing out of the internal strain induced b y the grinding and diffusion processes. New conditions for the diffusi on process, which reduce the induced strain on the B-AI diffused side, were established. An important improvement of the automotive diodes r eliability was obtained, the failure percentages diminishing by a fact or between 4 and 8, in operation and in RVT tests. (C) 1998 Elsevier S cience Ltd. All rights reserved.