M. Longo et al., INVESTIGATION OF GROWTH MODE BEHAVIOR AND SURFACE-MORPHOLOGY EVOLUTION OF METALORGANIC VAPOR-PHASE EPITAXY-GROWN ZNTE LAYERS ON (001)GAAS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(5), 1998, pp. 2650-2655
A systematic investigation on the mechanisms of nucleation and surface
morphology evolution was performed on ZnTe epilayers, deposited on ch
emically etched GaAs(001) by metalorganic vapor phase epitaxy. A 2D-3D
growth mode transition was observed at around two ZnTe equivalent mon
olyers (ML), which was ascribed to a Stransky-Krastanow growth mode. T
he 3D growth behavior was correlated to the development of {n11}-type
planes, leading to a surface ridging effect along the [1 (1) over bar
0] direction for 4000-ML-thick ZnTe epilayers. The use of a solid-on-
solid kinetic roughening model allowed the identification of a mechani
sm that limits the self- organization of ZnTe nanosized islands, namel
y, the high density of kink sites found in non- atomically flat GaAs s
ubstrates. (C) 1998 American Vacuum Society.