An analytical GaAs MESFET model capable of describing the current in t
he subthreshold region was derived. The model is based on the drift-di
ffusion transport mechanism, together with the drain-induced barrier l
owering (DIBL) effect, which is prevailing particularly in a short cha
nnel device. From this model the subthreshold currents for long channe
l as well as short channel and the subthreshold swings in two cases ar
e developed. Good agreement between the calculated and experimental re
sults can also be achieved. This model offers a basis for analysis and
simulation of small-geometry GaAs MESFET behavior in the subthreshold
region. (C) 1998 Elsevier Science Ltd.