Bi-layered ferroelectric SrBi2Ta2O9 (SBT) films were successfully prep
ared on Pt/Ti/SiO2/Si substrates at 650 degrees C by a modified rf mag
netron sputtering technique. The SET films annealed for 1 h in O-2 (76
0 torr) and again for 30 min in O-2 (5 torr) at 650 degrees C show a a
verage grain size of about 49 nm The SET films annealed at 65 0 degree
s C have a remanent polarization (P-r) of 6.0 mu C/cm(2) and coercive
field (E-c) of 36 kV/cm at an excitation voltage of 5 V, The films sho
wed fatigue-free characteristics up to 4.0 x 10(10) switching cycles u
nder 5 V bipolar pulse. The retention characteristics of SET films loo
ked very promosing up to 1.0 x 10(5) s.