RESISTANCE DEGRADATION BEHAVIOR OF BA0.7SR0.3TIO3 THIN-FILMS COMPAREDTO MECHANISMS FOUND IN TITANATE CERAMICS AND SINGLE-CRYSTALS

Authors
GROSSMANN M HOFFMANN S GUSOWSKI S WASER R STREIFFER SK BASCERI C PARKER CB LASH SE KINGON AI
Citation
M. Grossmann et al., RESISTANCE DEGRADATION BEHAVIOR OF BA0.7SR0.3TIO3 THIN-FILMS COMPAREDTO MECHANISMS FOUND IN TITANATE CERAMICS AND SINGLE-CRYSTALS, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 603-614
Citations number
14
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
Integrated ferroelectrics (Print) → ACNP
ISSN journal
10584587
Volume
22
Issue
1-4
Year of publication
1998
Pages
603 - 614
Database
ISI
SICI code
1058-4587(1998)22:1-4<603:RDBOBT>2.0.ZU;2-U
Abstract
The resistance degradation behavior of Ba0.7Sr0.3TiO3 (BST) and SrTiO3 (ST) thin films is compared to the degradation behavior of titanate s ingle crystals and ceramics with respect to the dependence on paramete rs such as temperature, thickness of the sample, applied voltage, acce ptor dopant concentration and electrode material. Different model cons iderations to explain the resistance degradation in titanate thin film s are discussed.