G. Teowee et Dr. Uhlmann, MODELING OF A THIN-FILM PYROELECTRIC PIXEL - TRANSIENT RESULTS, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 941-949
Pyroelectric thin films are receiving increasing attention for the nex
t generation of integrated room temperature uncooled IR arrays. Pixel
size and NETD (net equivalent temperature difference) of 50 mu m and 0
.005 K are projected respectively. In this study, the 1-D transient re
sponse of a pixel consisting of black absorber, pyroelectric, Pt, TiO2
, SiO2 and Si are performed. Thermal conduction and radiative transfer
are assumed to take place across this stack and at the Si substrate-a
ir interface, respectively. The effects of individual film thickness,
IR chopping frequency, thermal conductivity of the thermal barrier lay
er and substrate thickness on the pyroelectric response are investigat
ed.