InP islands are grown on a GaP substrate by organometallic vapor-phase
epitaxy using tertiarybutylphosphine and characterized by atomic forc
e microscopy and transmission electron microscopy. InP grows two-dimen
sionally at first and then begins to grow three-dimensionally at 1.2 M
L. The island sizes are 400 nm in lateral dimension and 100 nm in heig
ht at 1.8 ML with the growth temperature of 550 degrees C. The island
density increases with increasing InP layer thickness while the island
size remains the same. Misfit dislocations are observed in the island
s at 1.8 ML growth. By lowering growth temperature to 420 degrees C, t
he island size becomes as small as 40 nm in the lateral direction, mor
eover smaller islands without dislocations are obtained. The formation
mechanism of large islands is discussed. (C) 1998 Elsevier Science B.
V. All rights reserved.