Various terms such as 'cannot duplicate (CND)', 're-test OK (RTOK)', '
no fault indicated (NFI)', 'no fault found (NFF)', and 'no trouble fou
nd (NTF)', are used to describe the inability to replicate field failu
res during laboratory assessment. This paper uses CND to refer to all
such failures. CND failures can make up more than 85% of all observed
field failures in avionics and account for more than 90% of all mainte
nance costs. These statistics can be attributed to a limited understan
ding of root cause failure characteristics of complex systems, inappro
priate means of diagnosing the condition of the system, and the inabil
ity to duplicate the field conditions in the laboratory. This paper ad
dresses CND issues with reference to research carried out on samples o
f an electronics board used as the seat-back processor modules on boar
d the Boeing 777. The boards were monitored continuously using existin
g on-board comprehensive built-in test equipment. It was found that th
e hot temperature operating limits of the board decreased by up to 70
degrees C during highly accelerated environmental stress. Furthermore,
improperly seated connectors were found to result in spurious compone
nt failure reports from the built-in test equipment. This paper sugges
ts that the observed drift in operating limit and connector issues are
two likely root causes of CND failures and makes recommendations for
addressing them. (C) Crown Copyright 1998. Reproduced with the permiss
ion of the Controller of Her Majesty's Stationary Office.