PROCEEDINGS OF THE 2ND SESSION - ELECTRICAL AND PHYSICAL CHARACTERIZATION OF MATERIALS AND DEVICES FOR SILICON MICROELECTRONICS - JUNE 29 JULY 5, 1998, AUTRANS, FRANCE - PREFACE

Authors
BOUSSEY J GHIBAUDO G
Citation
J. Boussey et G. Ghibaudo, PROCEEDINGS OF THE 2ND SESSION - ELECTRICAL AND PHYSICAL CHARACTERIZATION OF MATERIALS AND DEVICES FOR SILICON MICROELECTRONICS - JUNE 29 JULY 5, 1998, AUTRANS, FRANCE - PREFACE, Microelectronic engineering, 40(3-4), 1998, pp. 111-112
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
40
Issue
3-4
Year of publication
1998
Pages
111 - 112
Database
ISI
SICI code
0167-9317(1998)40:3-4<111:POT2S->2.0.ZU;2-F