Sk. Kang et S. Purushothaman, STUDY OF INTERFACIAL REACTIONS BETWEEN TIN AND COPPER BY DIFFERENTIALSCANNING CALORIMETRY, Journal of electronic materials, 27(11), 1998, pp. 1199-1204
The interfacial reactions at the solder joints of interest in microele
ctronic structures have been extensively investigated in order to cont
rol the soldering process and thereby to provide strong and reliable s
older joints. These reactions comprise the dissolution of a base metal
into a molten solder, the concomitant growth of intermetallics in the
liquid state, and the growth of intermetallics in the solid state. Va
rious experimental techniques employed include conventional cross-sect
ional metallography, scanning electron microscopy, electron microprobe
analysis, x-ray diffraction and others. In this study, the interfacia
l reaction between tin and copper has been investigated by using diffe
rential scanning calorimetry which provides a simple means to study su
ch reactions and complements information obtained from other technique
s. The experimental results have been applied to understand the interf
acial reactions in two important examples: one for a soldering process
with copper metallization, and another for a high conductivity, Pb-fr
ee, electrically conducting adhesive which contains tin-coated copper
powder as conducting filler particles.