Nr. Shnidman et al., ONLINE FAULT-DETECTION FOR BUS-BASED FIELD-PROGRAMMABLE GATE ARRAYS, IEEE transactions on very large scale integration (VLSI) systems, 6(4), 1998, pp. 656-666
We introduce a technique for on-line built-in self-testing (BIST) of b
us-based held programmable gate arrays (FPGA's), This system detects d
eviations from the intended functionality of an FPGA without using spe
cial-purpose hardware, hardware external to the device, and without in
terrupting system operation. Such a system would be useful for mission
-critical applications with resource constraints. The system solves th
ese problems through an on-line fault scanning methodology. A device's
internal resources are configured to test for faults. Testing scans a
cross an FPGA, checking a section at a time. Simulation on a model FPG
A supports the viability and effectiveness of such a system.