M. Liehr et Gw. Rubloff, CONCEPTS IN COMPETITIVE MICROELECTRONICS MANUFACTURING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(4), 1994, pp. 2727-2740
While progress in the microelectronics industry is gated by the fronti
ers of high technology and its underlying science, competitiveness in
this industry is determined at least as much by how effectively the re
levant science and engineering are integrated to address those issues
central to manufacturing. Competitive manufacturing places a premium o
n such factors as rapid learning in technology development and yield e
nhancement, process and factory control, minimization of capital costs
, and equipment and product reliability, all factors which synthesize
the individual science and engineering elements associated with microe
lectronics technology. This paper is a primer for research aimed at im
pacting microelectronics manufacturing science and technology. After p
resenting an over-view of competitiveness requirements for manufacturi
ng, it focuses on strategic elements: advanced process equipment, proc
ess/materials characterization and real time process control, defect i
dentification/control and reliability, three-dimensional processing an
d manufacturability, and process integration.