CONCEPTS IN COMPETITIVE MICROELECTRONICS MANUFACTURING

Citation
M. Liehr et Gw. Rubloff, CONCEPTS IN COMPETITIVE MICROELECTRONICS MANUFACTURING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(4), 1994, pp. 2727-2740
Citations number
13
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
12
Issue
4
Year of publication
1994
Pages
2727 - 2740
Database
ISI
SICI code
1071-1023(1994)12:4<2727:CICMM>2.0.ZU;2-H
Abstract
While progress in the microelectronics industry is gated by the fronti ers of high technology and its underlying science, competitiveness in this industry is determined at least as much by how effectively the re levant science and engineering are integrated to address those issues central to manufacturing. Competitive manufacturing places a premium o n such factors as rapid learning in technology development and yield e nhancement, process and factory control, minimization of capital costs , and equipment and product reliability, all factors which synthesize the individual science and engineering elements associated with microe lectronics technology. This paper is a primer for research aimed at im pacting microelectronics manufacturing science and technology. After p resenting an over-view of competitiveness requirements for manufacturi ng, it focuses on strategic elements: advanced process equipment, proc ess/materials characterization and real time process control, defect i dentification/control and reliability, three-dimensional processing an d manufacturability, and process integration.