AMBIENT SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY ON GAAS (110) TREATED WITH (NH4)(2)S-X AND SES2 SOLUTIONS

Authors
NOZAKI S TAMURA S TAKAHASHI K
Citation
S. Nozaki et al., AMBIENT SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY ON GAAS (110) TREATED WITH (NH4)(2)S-X AND SES2 SOLUTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 297-304
Citations number
10
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
13
Issue
2
Year of publication
1995
Pages
297 - 304
Database
ISI
SICI code
1071-1023(1995)13:2<297:ASAAMO>2.0.ZU;2-E