CHARACTERIZATION OF A SINGLE-LAYER QUANTUM-WIRE STRUCTURE GROWN DIRECTLY ON A SUBMICRON GRATING

Citation
A. Gustafsson et al., CHARACTERIZATION OF A SINGLE-LAYER QUANTUM-WIRE STRUCTURE GROWN DIRECTLY ON A SUBMICRON GRATING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 308-317
Citations number
34
ISSN journal
10711023
Volume
13
Issue
2
Year of publication
1995
Pages
308 - 317
Database
ISI
SICI code
1071-1023(1995)13:2<308:COASQS>2.0.ZU;2-G