POSTFABRICATION RESISTANCE TRIMMING OF A SUPERCONDUCTING TUNNEL JUNCTION USING A FOCUSED ION-BEAM

Authors
BARBER ZH BLAMIRE MG DAWES NJ
Citation
Zh. Barber et al., POSTFABRICATION RESISTANCE TRIMMING OF A SUPERCONDUCTING TUNNEL JUNCTION USING A FOCUSED ION-BEAM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 318-320
Citations number
14
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
13
Issue
2
Year of publication
1995
Pages
318 - 320
Database
ISI
SICI code
1071-1023(1995)13:2<318:PRTOAS>2.0.ZU;2-0