GaN epitaxial thin films are grown on (0001)sapphire by plasma-excited
organometallic vapor phase epitaxy (OMVPE) in which RF-excited N-2 is
utilized as reactive nitrogen source. Dependence of growth rate, surf
ace morphology, and crystalline quality on growth conditions is system
atically investigated. GaN epitaxial layer with a mirror-like surface
is obtained without any buffer layer technique. This is attributed to
extremely high nucleation density by the plasma-excited OMVPE at an ea
rly stage of the growth. Nucleation process of the plasma-excited OMVP
E is compared with that of a conventional OMVPE using NH3.