THERMAL-ANALYSIS OF GAAS POWER MONOLITHIC MICROWAVE ICS MOUNTED WITH EPOXY ATTACHMENT

Citation
K. Nishihori et al., THERMAL-ANALYSIS OF GAAS POWER MONOLITHIC MICROWAVE ICS MOUNTED WITH EPOXY ATTACHMENT, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(2), 1997, pp. 220-224
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
ISSN journal
10709886
Volume
20
Issue
2
Year of publication
1997
Pages
220 - 224
Database
ISI
SICI code
1070-9886(1997)20:2<220:TOGPMM>2.0.ZU;2-8
Abstract
The effect of chip-mounting attachment on the thermal resistance of Ga As power field effect transistor (FET) modules has been experimentally investigated, The thermal resistance was evaluated for different GaAs chip thickness of 150 and 250 mu m through an electrical method utili zing temperature dependence of Schottky-barrier in the GaAs metal semi conductor FET's (MESFET's). The thermal resistance of low-cost epoxy-m ounted GaAs chips, suitable for uniplanar monolithic microwave IC's (M MIC's), was found not to increase even up to a chip thickness of 250 m u m, while that of AuSn-mounted GaAs chips increased as was convention ally expected, Numerical simulation has also been presented for the si milar case of GaAs power MMIC's. The result of simulation suggests tha t lower thermal conductivity of attachment material, such as epoxy att achment, leads to larger optimum chip thickness that minimizes the tot al thermal resistance.