A NEW METHOD TO PERFORM IN-SITU CURRENT-VOLTAGE CURVES WITH AN ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE

Authors
ABADAL G PEREZMURANO F BARNIOL N BORRISE X AYMERICH X
Citation
G. Abadal et al., A NEW METHOD TO PERFORM IN-SITU CURRENT-VOLTAGE CURVES WITH AN ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE, Ultramicroscopy, 66(3-4), 1996, pp. 133-139
Citations number
25
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
66
Issue
3-4
Year of publication
1996
Pages
133 - 139
Database
ISI
SICI code
0304-3991(1996)66:3-4<133:ANMTPI>2.0.ZU;2-5
Abstract
A new method to perform in situ current voltage curves with an electro chemical scanning tunneling microscope under bipotentiostatic control is presented. The method eliminates the effect of (a) high parasitic c apacitances that are present when tip and sample are immersed in a liq uid and (b) electrochemical currents due to the effect of a polarizati on out of the usual tip versus electrolyte voltage window. Several app lications to the study of silicon surfaces in HF solutions are shown.