Tl. Porter et al., NANOMETER-SCALE STRUCTURE OF HECTORITE-ANILINE INTERCALATES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 500-504
Citations number
18
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The inclusion of the organic guest aniline into Cu(II)-exchanged hecto
rite thin films has been investigated. The subsequent polymerization o
f aniline on the clay surface and in the intergallery regions are stud
ied using scanning force microscopy (SFM), electron paramagnetic reson
ance (EPR) spectroscopy, powder x-ray diffraction (XRD), and impedance
spectroscopy;EPR and XRD data show that in addition to strong polymer
ization of aniline on the clay surface, polymerization also occurs in
the intergallery regions of the clay. Using standard lift-off techniqu
es or razor cleaving, the exposed intergallery polyaniline is successf
ully imaged for the first time using noncontract SFM in phase-contrast
mode. The nearly two-dimensional polymer sheets formed in these regio
ns exhibit none of the nanometer-scale grain of bundle structure commo
nly associated with polyaniline synthesized using techniques such as e
lectrochemical or vacuum deposition. The electrical response of the re
sulting clay-conducting polymer composites is also investigated for th
in films fabricated on 15 mu m interdigitated arrays. Preliminary resu
lts indicate that these composite materials may be highly suitable as
chemical sensors for a variety of important gases and vapors such as e
thanol and hexane. (C) 1997 American Vacuum Society.