LASER-PULSE DESORPTION UNDER SCANNING TUNNELING MICROSCOPE TIP-CL REMOVAL FROM SINGLE-SITE ON SI(100)

Citation
Z. Dohnalek et al., LASER-PULSE DESORPTION UNDER SCANNING TUNNELING MICROSCOPE TIP-CL REMOVAL FROM SINGLE-SITE ON SI(100), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 1488-1492
Citations number
26
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
15
Issue
3
Year of publication
1997
Part
2
Pages
1488 - 1492
Database
ISI
SICI code
0734-2101(1997)15:3<1488:LDUSTM>2.0.ZU;2-Q
Abstract
The desorption of pairs of chlorine atoms influenced by the tip of a s canning tunneling microscope is achieved at preselected sites on the C l-saturated Si(100)-(2X1) surface using nanosecond laser pulse irradia tion of the tip within the tunneling range. Bright features observed f or the empty state topographic images after a laser pulse sequence are interpreted to be due to bare Si-Si dimers formed by laser induced de sorption of two Cl atoms underneath the tip. The Cl desorption mechani sm involves the enhancement of the sample-tip interaction due to laser pulse induced tip heating and tip expansion. (C) 1997 American Vacuum Society.