Cy. Cha et al., SURFACE MORPHOLOGIES ASSOCIATED WITH THERMAL-DESORPTION - SCANNING FUNNELING MICROSCOPY STUDIES OF BR-GAAS(110), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 605-609
Scanning tunneling microscopy was used to characterize the developing
surface morphology found during typical temperature programmed desorpt
ion experiments for halogen-GaAs. Surfaces exposed to Br-2 at 300 K we
re heated to temperatures between 450 and 675 K, followed by scanning
at room temperature. This made it possible to relate the temperature-d
ependent gas phase etch product distribution to the surface structure
and thereby examine atomic-level surface processes associated with the
evolution of volatile products. We associate the desorption of GaBr3
around 500 K with the initiation of single-layer-deep terrace pits. De
sorption of GaBr and As-2 above 600 K accounts for the lateral enlarge
ment of the pits. (C) 1997 American Vacuum Society.