Cp. Chang et al., POLYCIDE GATE ETCHING USING A HELICAL RESONATOR ON AN APPLIED MATERIALS PRECISION-5000 PLATFORM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 646-651
We modified a polycide gate etching chamber of an Applied Materials Pr
ecision 5000 platform to accept a commercially available Prototech 150
-mm-diam helical resonator plasma source to extend the utility of this
proven manufacturing platform to 0.25 mu m technology and beyond. We
successfully demonstrated the use of the helical resonator on the Prec
ision 5000 platform to etch WSix/alpha-Si gate stacks using a multiste
p process. At low pressures (<10 mTorr), the helical resonator etches
polysilicon and WSix more uniformly than a standard Precision 5000 MER
IE chamber. In addition, the WSix-to-alpha-Si selectivity for the WSix
etching step is also higher with the high-density source. (C) 1997 Am
erican Vacuum Society.