ROUGHNESS AND IR2 X IR FUNCTION-ANALYSIS - APPLICATIONS IN MATERIAL SCIENCE

In the case of absence of overlaps, roughness investigation can be stu died from IR2 x IR function analysis methods. These IR2 x IR functions correspond to a true topography or a perspective representation. They can be quantitatively described directly from basic stereological par ameters or after morphological transformations. Some examples in mater ial science are given using scanning electron or confocal microscope i mages.