APPLICATIONS OF ORIENTATION MAPPING BY SCANNING AND TRANSMISSION ELECTRON-MICROSCOPY

The potentials of orientation mapping techniques (in the following ref erred to as OIM) for studies of thermomechanical processes are analyse d. Both transmission electron microscopy (TEM) and scanning electron m icroscopy (SEM) based OIM techniques are considered. Among the thermom echanical processes, focus is on cold deformation and recrystallizatio n processes. It is described how the OIM techniques may be applied for studies of such processes. Results of OIM measurements supplement mor e traditional TEM and SEM microstructure characterizations as well as bulk texture measurements, and new information is achieved when the re sults of OIM and these various techniques are combined. Examples hereo f are given to illustrate the potentials of OIM techniques. Finally, l imitations of TEM and SEM based OIM for specific applications are disc ussed.