SYNTHESIS OF ANALYTICAL AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY TO DETERMINE THE INTERFACE STRUCTURE OF CU AL2O3/

Citation
G. Dehm et al., SYNTHESIS OF ANALYTICAL AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY TO DETERMINE THE INTERFACE STRUCTURE OF CU AL2O3/, Ultramicroscopy, 67(1-4), 1997, pp. 207-217
Citations number
38
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
67
Issue
1-4
Year of publication
1997
Pages
207 - 217
Database
ISI
SICI code
0304-3991(1997)67:1-4<207:SOAAHT>2.0.ZU;2-U
Abstract
The structure of Cu/Al2O3 interfaces has been studied by high-resoluti on transmission electron microscopy (HRTEM) and analytical TEM. The us e of electron energy-loss spectroscopy (EELS) in the determination of the local coordinations and bonding mechanisms at the interface is sho wn to be an essential extension for atomic structure evaluation by qua ntitative high-resolution TEM. A refined atomic model of the Cu/Al2O3 interface is then retrieved by iterative digital image matching. Multi ple scattering calculations based on this model are vital to explain t he interface specific components in the EELS O-K edge. The atomistic c onfiguration at the interface is described by a structure model with C u-O bonds across the interface.