X-RAY-DIFFRACTION FROM SINGLE FIBERS OF SPIDER SILK

Authors
BRAM A BRANDEN CI CRAIG C SNIGIREVA I RIEKEL C
Citation
A. Bram et al., X-RAY-DIFFRACTION FROM SINGLE FIBERS OF SPIDER SILK, Journal of applied crystallography, 30, 1997, pp. 390-392
Citations number
13
Categorie Soggetti
Crystallography
Journal title
Journal of applied crystallography → ACNP
ISSN journal
00218898
Volume
30
Year of publication
1997
Part
3
Pages
390 - 392
Database
ISI
SICI code
0021-8898(1997)30:<390:XFSFOS>2.0.ZU;2-P
Abstract
Wide-angle X-ray diffraction patterns of single spider-silk fibres of less than or equal to 5 mu m diameter can be obtained at a third-gener ation synchrotron-radiation source in a few seconds per pattern. This is sufficient to observe the strongest equatorial and first layer line reflections. For higher-resolution structural work, data have to be r ecorded with cryocooling techniques in order to maintain the crystalli nity of the sample for several minutes.