CZOCHRALSKI GROWTH AND CHARACTERIZATION OF (LU1-XGDX)(2)SIO5 SINGLE-CRYSTALS FOR SCINTILLATORS

Citation
Gb. Loutts et al., CZOCHRALSKI GROWTH AND CHARACTERIZATION OF (LU1-XGDX)(2)SIO5 SINGLE-CRYSTALS FOR SCINTILLATORS, Journal of crystal growth, 174(1-4), 1997, pp. 331-336
Citations number
10
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
174
Issue
1-4
Year of publication
1997
Pages
331 - 336
Database
ISI
SICI code
0022-0248(1997)174:1-4<331:CGACO(>2.0.ZU;2-X
Abstract
The Czochralski growth of high quality single crystals of cerium doped mixed oxyorthosilicates, (Lu1-xGdx)(2)SiO5, where, x = 0, 0.2, 0.5, 0 .9, and 1.0 is reported. Their growth conditions, defects, structural stability, physical and scintillation properties versus composition ha ve been evaluated. The mixed crystals can be an alternative to both LS O and GSO scintillators.