X-RAY AND SPECTRAL CHARACTERIZATION OF DEFECTS IN GARNETS

Citation
A. Lupei et al., X-RAY AND SPECTRAL CHARACTERIZATION OF DEFECTS IN GARNETS, Journal of crystal growth, 177(3-4), 1997, pp. 207-210
Citations number
11
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
177
Issue
3-4
Year of publication
1997
Pages
207 - 210
Database
ISI
SICI code
0022-0248(1997)177:3-4<207:XASCOD>2.0.ZU;2-6
Abstract
New information on the defects in high temperature (HT) grown YAG (Y3A l5O12) and GGG(Gd3Ga5O12) obtained from X-ray and optical spectroscopy of various rare earth dopants are presented. Low intensity {222} X-ra y reflections, forbidden in the cubic garnet Ia3d space group, with eq uivalent intensities for the four [111] directions are observed in bot h crystals. Structural arguments in connection with optical spectrosco py data on Various ions (Nd3+, Tm3+, Pr3+) allow us to assign these re flections (absent in flux grown crystals) to local reduction of symmet ry introduced by nonstoichiometric random occupancy of octahedral site s by Y3+ or Gd3+ ions in HT garnets.