ORIENTATION AND ORDER IN MICROCONTACT-PRINTED, SELF-ASSEMBLED MONOLAYERS OF ALKANETHIOLS ON GOLD INVESTIGATED WITH NEAR-EDGE X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY
D. Fischer et al., ORIENTATION AND ORDER IN MICROCONTACT-PRINTED, SELF-ASSEMBLED MONOLAYERS OF ALKANETHIOLS ON GOLD INVESTIGATED WITH NEAR-EDGE X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2173-2180
Citations number
33
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Near edge x-ray absorption fine structure spectroscopy (NEXAFS) was us
ed to investigate contact-printed (CP), self-assembled monolayers (SAM
s) of alkanethiols on gold. We studied the influence on order and orie
ntation of the alkyl chains of both the chain length of the thiols and
the concentration of the inking solution that was used for stamping.
The results are compared to those for monolayers prepared by the conve
ntional technique of immersing the substrate into solution. Our study
shows that the CP process, when performed with a sufficiently concentr
ated solution of the thiol, can result in monolayers indistinguishable
from those established by immersion into solution, independent of the
thiol chain length. For lower concentrations, however, CP monolayers
show a significant deviation from well-ordered films and have to be cl
assified as mainly disordered. As with SAMs prepared from solution, sh
orter chains (dodecanethiol) lead to a lower degree of order compared
to longer ones (hexadecanethiol), which can be attributed to their rel
atively higher percentage of gauche conformations at room temperature.
Nevertheless, with lateral force microscopy a slight contrast is stil
l observable between immersed and microcontact-printed (mu CP) areas o
f well-ordered films, as has been previously reported by other groups
and attributed to slight differences in the packing density of the cha
ins in the differently prepared regions of the final layer. On the bas
is of our NEXAFS data the difference of gauche defects due to differen
t average packing densities in the resulting layers can be estimated t
o be less than 30%. (C) 1997 American Vacuum Society.