Mal. Johnson et al., GROWTH OF GAN, INGAN, AND ALGAN FILMS AND QUANTUM-WELL STRUCTURES BY MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 175, 1997, pp. 72-78
GaN, AlGaN and InGaN films have been grown by molecular beam epitaxy (
MBE) using RF plasma sources for the generation of active nitrogen. Th
ese films have been deposited homoepitaxially onto GaN/SiC substrates
and heteroepitaxially onto LiGaO2 substrates. LiGaO2 is an ordered and
closely-lattice-matched orthorhombic variant of the wurtzite crystal
structure of GaN. A low-temperature AlN buffer layer is necessary in o
rder to nucleate GaN on LiGaO2. Thick GaN and AlGaN layers may then be
grown once deposition is initiated. InGaN has been grown by MBE at mo
le fractions of up to 20% as a quantum well between GaN cladding layer
s. The indium containing structures were deposited onto GaN/SiC substr
ates to focus the development effort on the InGaN growth process rathe
r than on heteroepitaxial nucleation. A modulated beam technique, with
alternating short periods of (In, Ga)N and (Ga)N, was used to grow hi
gh-quality InGaN. The modulated beam limits the nucleation of metal dr
oplets on the growth surface, which form due to thermodynamic limitati
ons. A narrow PL dominated by band edge luminescence at 421 nm results
from this growth technique. Growth of GaN at high temperatures is als
o reported.