K. Mizushima et al., EFFECT OF HYDROGEN ON THE GROWTH-KINETICS OF SI(001) DURING GSMBE FROM DISILANE, Journal of crystal growth, 175, 1997, pp. 509-513
The effects of hydrogen on the growth kinetics of Si(0 0 1) during gas
-source molecular-beam epitaxy from disilane are investigated with kin
etic Monte Carlo simulations. The growth model includes the surface de
composition of disilane, which requires four mobile and reactive surfa
ce species: Si, H, SIH2 and SiH3. Based on recent reflectance anisotro
py measurements, the desorption of hydrogen is presumed to occur prefe
rentially from step edges. Below approximately 400 degrees C (where th
e model allows surface reactions to occur) the accumulation of surface
hydrogen is found to prevent growth, but for temperatures above 600 d
egrees C, where the surface lifetime of the hydrogen is relatively sho
rt, we find no significant differences in the overall growth features
in comparison with a solid-source (no hydrogen) growth model of Si(0 0
1). At intermediate temperatures, where surface hydrogen atoms are pr
esent but do not prevent growth, we find a higher density of smaller i
slands and rougher propagating step edges in comparison with those of
the solid-source model. Anisotropic morphological features, which are
characteristic signatures in the solid-source model, are suppressed by
the surface hydrogen atoms in the gas-source model.