REDUCTION OF EXTENDED DEFECTS IN II-VI BLUE-GREEN LASER-DIODES

Citation
Tb. Ng et al., REDUCTION OF EXTENDED DEFECTS IN II-VI BLUE-GREEN LASER-DIODES, Journal of crystal growth, 175, 1997, pp. 552-557
Citations number
23
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
175
Year of publication
1997
Part
1
Pages
552 - 557
Database
ISI
SICI code
0022-0248(1997)175:<552:ROEDII>2.0.ZU;2-0
Abstract
Early blue-green laser diodes based on ZnSe exhibited room temperature , continuous wave (cw) lifetimes of the order of a minute. Similar to the history of (Al,Ga)As lasers, the source of the degradation was the presence of extended crystalline defects. The dominant extended defec ts in the cal ly room temperature cw lasers originated as stacking fau lts generated at the ZnSe GaAs heterovalent nucleation event, and exhi bited densities of the order of 10(6) cm(-2). In this paper a procedur e is described which will reduce the density of such extended defects to the mid to low 10(3) cm(-2) over a 3 in diameter wafer.