R. Aschenbrenner et al., A new approach for system integrated packaging, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 41-45
As the number of applications for flexible assemblies is growing there is a
lso a target variation of requirements for such packages. Therefore, differ
ent technologies from CSP's to Smart Cards have been developed.
This paper describes the results of the development of a new approach to wa
fer-level redistribution as well as packaging concepts for. CSP's and embed
ding of ultra-thin IC's into laminated substrates. The electrical interconn
ection is made by fully-additive deposition of Cu lines. The technology is
based on wet-chemical treatments which allow to avoid expensive vacuum proc
esses and electroplating. A photo-sensitive epoxy material, commonly used i
n printed circuit board manufacturing, was chosen as dielectric. Furthermor
e the process implements electroless Ni deposition to protect the Al bondpa
ds and to act as solder diffusion barrier on the Cu lines The technologies
are presented together with the important parameters and the typical result
s achieved. In order to evaluate the applicability of the processes develop
ed, the reliability data of the obtained assemblies is presented and compar
ed.