Interdiffusion between Cu and Sn-rich solder: Dominant diffusion species

Authors
Citation
Sj. Kim et Ks. Bae, Interdiffusion between Cu and Sn-rich solder: Dominant diffusion species, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 81-85
Citations number
11
Categorie Soggetti
Current Book Contents
Year of publication
2000
Pages
81 - 85
Database
ISI
SICI code
Abstract
Extensive microstructural and kinetic studies on the formation and growth o f the intermetallics of Sn-rich solder/Cu couples have been reported. Howev er, experimental data on the dominant diffusing species are limited and in conflict. The dominant diffusing species for the soldering and aging of Sn- 3.5Ag alloy/Cu couples were investigated by using unsoldered or Cr-evaporat ed surface as a reference line. After soldering, the Sn-rich alloy on top o f the scallop-shaped Cu6Sn5 intermetallic compound was observed below the o riginal Cu surface. Sn was also observed to diffuse to Cu during the aging process. Therefore, Sn was suggested to be the dominant diffusing species f or both soldering and aging.